• DocumentCode
    2262612
  • Title

    Estimating accuracy and confidence interval of an Intelligent Diagnostic Reasoner System

  • Author

    Das, Sreerupa ; Harris, Michelle

  • Author_Institution
    Simulation Training & Support, Lockheed Martin, Orlando, FL, USA
  • fYear
    2009
  • fDate
    14-17 Sept. 2009
  • Firstpage
    288
  • Lastpage
    291
  • Abstract
    Intelligent diagnostic reasoning system (IDRS), developed by Lockheed Martin Simulation, Training & Support (LM STS), implements a Bayesian model that is able to reduce the time and cost to diagnose failures by isolating faults[1]. As is the case with all learning systems, the quality of diagnosis is expected to increase with time as more data is presented and more knowledge is absorbed by the system. Since learning is an ongoing process, at any given time, we would like to get an estimate on the accuracy of the system given the data it has seen so far and the Bayesian network structure it started with. In this paper we describe one approach for estimating the accuracy of diagnosis in an IDRS system. We also outline a method to compute the confidence interval on the estimated accuracy of the system. In addition, we present a way to define confidence intervals for individual probabilities of diagnosing faults. These measures combined allow us to appropriately quantify confidence in a learning system. Finally, we illustrate results from our simulation on accuracy estimation and determination of confidence intervals in IDRS using field data.
  • Keywords
    belief networks; diagnostic reasoning; fault diagnosis; learning systems; Bayesian network structure; IDRS; confidence interval estimation; fault diagnosis; intelligent diagnostic reasoner system; learning system; probability; Artificial intelligence; Bayesian methods; Computational modeling; Costs; Data engineering; Intelligent systems; Learning systems; Sociotechnical systems; Testing; USA Councils; Bayesian Network; Confidence interval; component;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2009 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4244-4980-4
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2009.5314019
  • Filename
    5314019