The application of computer-aided sensitivity analysis to a parallel resonant transistor microwave oscillator circuit

Author

Tanzi, Nebil

Author_Institution

Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA

fYear

1993

fDate

16-18 Aug 1993

Firstpage

801

Abstract

A methodology which allows one to perform sensitivity analysis on a given oscillator circuit prior to its construction is described. The method uses a computer program developed to obtain the solution of the oscillation equations, and commercially available curve-fitting routine. Classical sensitivity analysis methods are applied to obtain the first order and multi-parameter sensitivities of the embedding elements with respect to the variations of the s-parameters of the active device. The results of the sensitivity computations applied to a parallel resonant microwave oscillator circuit are presented

Keywords

S-parameters; circuit analysis computing; circuit resonance; curve fitting; microstrip circuits; microwave circuits; microwave oscillators; sensitivity analysis; active device; computer-aided sensitivity analysis; curve-fitting routine; embedding elements; microwave oscillator circuit; multi-parameter sensitivities; oscillation equations; parallel resonant transistor oscillator; s-parameters; Application software; Circuits; Computer applications; Concurrent computing; Curve fitting; Equations; Oscillators; Resonance; Scattering parameters; Sensitivity analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1993., Proceedings of the 36th Midwest Symposium on

Conference_Location

Detroit, MI

Print_ISBN

0-7803-1760-2

Type

conf

DOI

10.1109/MWSCAS.1993.343190

Filename

343190