• DocumentCode
    2264652
  • Title

    3D integration technologies for MEMS/IC systems

  • Author

    Ramm, Peter ; Klumpp, Armin ; Weber, Josef

  • Author_Institution
    Munich Div., Fraunhofer Inst. for Reliability & Microintegration, Munich, Germany
  • fYear
    2009
  • fDate
    12-14 Oct. 2009
  • Firstpage
    138
  • Lastpage
    141
  • Abstract
    3D integration is a key solution to the predicted performance problems of future ICs as well as it offers extreme miniaturization and cost-effective fabrication of so-called more than Moore products as e.g. MEMS/IC systems. Through silicon via (TSV) technologies enable high interconnect performance at relatively high fabrication cost compared to 3D packaging. In general it is not only one 3D integration technology suitable for the fabrication of the large variety of 3D integrated systems. Moreover, even one single product may need several different technologies for a cost-effective fabrication. Wireless sensor systems (e.g. e-CUBESreg) an excellent example for the need of a suitable mixture. Consisting of MEMS, ICs, memories, antennas and power modules they can only be fabricated in a cost-efficient way by application of specific optimized 3D technologies for the integration of the different sub-modules. The technology choice for an e-CUBES demonstrator is described.
  • Keywords
    integrated circuit interconnections; microfabrication; 3D integration technologies; 3D packaging; MEMS-IC systems; Moore products; antennas; cost-effective fabrication; e-CUBES demonstrator; power modules; through silicon via technologies; wireless sensor systems; Micromechanical devices; 3D Integration; 3D-IC; ICV-SLID; MEMS; More than Moore; TPMS; TSV technology; Through Silicon Via; e-CUBES; heterogeneous systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE
  • Conference_Location
    Capri
  • ISSN
    1088-9299
  • Print_ISBN
    978-1-4244-4894-4
  • Electronic_ISBN
    1088-9299
  • Type

    conf

  • DOI
    10.1109/BIPOL.2009.5314117
  • Filename
    5314117