DocumentCode
2265409
Title
Build-in-self-test of a real time digital signal processing system
Author
Yuan, Haipeng ; Long, Teng ; Yue, Yansheng
Author_Institution
Dept. of Electron. Eng., Beijing Inst. of Technol., China
fYear
2001
fDate
2001
Firstpage
983
Lastpage
986
Abstract
A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing. It can integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered and the performance of the time domain processing test and frequency domain processing test are analysed
Keywords
Doppler radar; automatic testing; built-in self test; frequency-domain analysis; radar signal processing; telecommunication equipment testing; time-domain analysis; BIST; board-level testing; built-in self-test; frequency domain processing; off-line testing; on-line testing; real time digital signal processor; system adjustment; system-level testing; time domain processing; Built-in self-test; Circuit faults; Circuit testing; Digital signal processing; Digital signal processors; Frequency domain analysis; Random access memory; Read-write memory; Real time systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radar, 2001 CIE International Conference on, Proceedings
Conference_Location
Beijing
Print_ISBN
0-7803-7000-7
Type
conf
DOI
10.1109/ICR.2001.984875
Filename
984875
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