• DocumentCode
    2269461
  • Title

    Effective permittivity of a random mixture with spherical inclusions

  • Author

    Kärkkäinen, Kimmo ; Sihvola, Ari ; Nikoskinen, Keijo

  • Author_Institution
    Electromagn. Lab., Helsinki Univ. of Technol., Espoo, Finland
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    2371
  • Abstract
    The paper reports the results of a numerical analysis of electric field in random dielectric materials. The effective permittivity of a three-dimensional mixture is calculated by the finite difference method. The studied mixture is a two-component mixture with a homogeneous background in which spheres of another material are embedded in random positions. A new technique to derive difference equations in the neighborhood of material interfaces is considered. Hundreds of mixture samples with different random inclusion distributions are analysed to get a good insight into average characteristics of the mixture material. The calculated permittivity distributions are also compared with well-known theoretical models such as Maxwell Garnett and Bruggeman models
  • Keywords
    finite difference methods; geophysical techniques; permittivity; radar cross-sections; radar theory; random media; remote sensing by radar; terrain mapping; terrestrial electricity; dielectric constant; difference equations; effective permittivity; electric field; finite difference method; geoelectric method; geophysical measurement technique; homogeneous background; land surface; microwave radiometry; numerical analysis; radar remote sensing; radar scattering; random dielectric material; random mixture; random positions; spherical inclusion; terrain mapping; terrestrial electricity; theoretical model; three-dimensional mixture; two-component mixture; Boundary conditions; Dielectric materials; Electric potential; Electrostatics; Equations; Finite difference methods; Geometry; Insulation; Lattices; Permittivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.858412
  • Filename
    858412