DocumentCode
2271163
Title
Testing microprocessor-based boards (VXI/PXI Plug and Play technology applications)
Author
Gutterman, Loofie
Author_Institution
Geotest-Marvin Test Systems, Inc, Irvine, CA, USA
fYear
2003
fDate
22-25 Sept. 2003
Firstpage
294
Lastpage
297
Abstract
Testing microprocessor-based boards (μP) could be a challenge even for the experienced test engineer. This paper reviews the related challenges and available test philosophies for the functional testing of these products.
Keywords
integrated circuit testing; microprocessor chips; peripheral interfaces; printed circuit testing; synchronisation; test equipment; external test equipment; functional testing; microprocessor-based board testing; test challenges; test philosophies; Circuit faults; Circuit testing; Electronic equipment testing; Emulation; Instruments; Microprocessors; Power engineering and energy; Read only memory; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN
1080-7725
Print_ISBN
0-7803-7837-7
Type
conf
DOI
10.1109/AUTEST.2003.1243591
Filename
1243591
Link To Document