DocumentCode
2271191
Title
On-wafer measurement of microstrip-based MIMICs without via holes
Author
Strauss, G. ; Ehret, P. ; Menzel, W.
Author_Institution
Microwave Tech., Ulm Univ., Germany
Volume
3
fYear
1996
fDate
17-21 June 1996
Firstpage
1399
Abstract
Typically, on-wafer measurements of microstrip based MMICs require via holes as ground contacts. To avoid these, the design of ground contacts for on-wafer probing at mm-wave frequencies using electromagnetic field coupling is presented in this paper. Theoretical and experimental results of the respective transitions are given as well as a test deembedding this transition from the behaviour of a transmission line.
Keywords
MIMIC; integrated circuit measurement; microstrip circuits; millimetre wave measurement; MM-wave frequency; electromagnetic field coupling; ground contact; microstrip-based MIMIC; on-wafer measurement; transition; transmission line; Circuit testing; Coplanar waveguides; Distributed parameter circuits; Finite difference methods; Gallium arsenide; Microstrip; Radio frequency; Resonance; Transmission line theory; Waveguide transitions;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location
San Francisco, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-3246-6
Type
conf
DOI
10.1109/MWSYM.1996.512197
Filename
512197
Link To Document