DocumentCode
2271504
Title
PC based, IEEE signal & test description standard, synthetic instruments
Author
Cornish, Matt ; Hazelwood, R. ; Gorringe, Chris
fYear
2003
fDate
22-25 Sept. 2003
Firstpage
411
Lastpage
418
Abstract
There exists a trend in automatic test environments (ATE) towards the synthesis of signals using digital memory devices, which, through recent advances in technology, are now able to achieve output at frequencies that were previously the domain of analogue devices. This paper discusses the use of a recent trend in PC technology, DirectX®, to enable real-time streaming of test signal definitions directly to digital memory devices, onboard a standard PC that is also running the automated test program (ATP). We consider the use of the emerging IEEE signal & test description (STD) standard to allow us to define stimulus signals using the STD basic signal components (e.g. sinusoid, AM, clock). We have devised a system that enables us to design, simulate and implement complex stimulus signals and measurements at useful frequencies, on a single machine. We have used STD to ensure an international standard, providing flexibility, portability and a natural source for simulation. By mapping STD signal modelling language (SML) onto a DirectX® framework, we have created a real-time simulation and, through onboard PC hardware, a real-world signal.
Keywords
IEEE standards; automatic test equipment; automatic test software; signal synthesis; virtual instrumentation; waveform generators; AM signal; ATE; ATP; DirectX; IEEE signal & test description standard; PC based signal synthesis; SML; STD basic signal components; automated test program; automatic test environments; clock signal; digital signal synthesis; real-time streaming; signal modelling language; sinusoidal signal; test signal definitions; Automatic testing; Clocks; Computational modeling; Frequency synthesizers; Hardware; Instruments; Signal design; Signal generators; Signal synthesis; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
ISSN
1080-7725
Print_ISBN
0-7803-7837-7
Type
conf
DOI
10.1109/AUTEST.2003.1243606
Filename
1243606
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