Spatial-correlation-aware soft error rate analysis using quasi-importance sampling

Author

Wu, Xin-Tian Lena ; Hsu, Kai-Hua Dennis ; Chang, Lynn C -L ; Wen, Charles H -P

Author_Institution

Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

fYear

2012

fDate

23-25 April 2012

Firstpage

1

Lastpage

4

Abstract

Since statistical methods are important to accurately estimate the soft error rate (SER) of circuits with process variations, we incorporate the spatial correlation into SSER analysis to provide better accuracy. Moreover, the SSER analysis based on quasi-Monte Carlo comes into the difficulty of sampling points on a non-uniform distribution or unbounded distribution. Therefore, in this paper, we employ the quasi-importance sampling into Monte-Carlo simulation to overcome such sampling issue. Experimental results show that the quasi-importance sampling Monte-Carlo SSER analysis framework is capable of more precisely estimating circuit SSERs and reaches 3.72X speedups when compared to the baseline Monte-Carlo simulation.

Keywords

importance sampling; radiation hardening (electronics); Monte-Carlo simulation; nonuniform distribution; quasi-Monte Carlo; quasiimportance sampling; spatial-correlation-aware soft error rate analysis; statistical method; unbounded distribution; Accuracy; Logic gates; Runtime; importance sampling; quasi-monte carlo; spatial correlations; statistical soft error rate;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, Automation, and Test (VLSI-DAT), 2012 International Symposium on

Conference_Location

Hsinchu

ISSN

PENDING

Print_ISBN

978-1-4577-2080-2

Type

conf

DOI

10.1109/VLSI-DAT.2012.6212616

Filename

6212616