• DocumentCode
    2272336
  • Title

    Gauging acceptance of software metrics: Comparing perspectives of managers and developers

  • Author

    Umarji, Medha ; Seaman, Carolyn

  • Author_Institution
    Dept. of Inf. Syst., Univ. of Maryland Baltimore County, Baltimore, MD, USA
  • fYear
    2009
  • fDate
    15-16 Oct. 2009
  • Firstpage
    236
  • Lastpage
    247
  • Abstract
    Metrics efforts are often impeded by factors such as poor data quality and developer resistance. To better understand and thus to address the developer perspective in a metrics program we undertook a case study at a large multi-national corporation. We identified six projects, and conducted surveys of both project managers and developers. These surveys were based on the metrics acceptance model (MAM) which is a framework (i.e. a model of relationships between factors, operationalized by a survey instrument) for gauging developer opinions toward software metrics. We noticed some interesting differences between developers´ and managers´ perceptions of metrics. While managers were on the same page as developers when it came to factors such as ease of use of the metrics tool, they over-estimated developers´ confidence to report accurate measures. Managers under-estimated developers´ beliefs about the usefulness of metrics and about their fear of adverse consequences. These findings suggest that the MAM could provide useful insights to project managers to train and motivate their developers. We also found that the MAM can be an effective diagnostic tool both at an organizational and project level to identify potential impediments in metrics programs.
  • Keywords
    program diagnostics; software metrics; software tools; diagnostic tool; metrics acceptance model; metrics tool; software metrics; Electrical resistance measurement; Engineering management; Impedance; Project management; Quality management; Software development management; Software engineering; Software measurement; Software metrics; Software quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Empirical Software Engineering and Measurement, 2009. ESEM 2009. 3rd International Symposium on
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    1938-6451
  • Print_ISBN
    978-1-4244-4842-5
  • Electronic_ISBN
    1938-6451
  • Type

    conf

  • DOI
    10.1109/ESEM.2009.5315999
  • Filename
    5315999