• DocumentCode
    2273339
  • Title

    MRTD analysis of dielectric cavity structures

  • Author

    Robertson, R. ; Tentzeris, E. ; Krumpholz, M. ; Katehi, L.P.B.

  • Author_Institution
    Radiation Lab., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    3
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    1861
  • Abstract
    Multiresolution time domain (MRTD) analysis is applied to model anisotropic dielectric material. In particular, an MRTD scheme based on scaling functions only is used to analyze different types of resonant cavity structures. The results agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computational time in comparison to FDTD, while maintaining the same accuracy of the results.
  • Keywords
    cavity resonators; dielectric resonators; numerical analysis; time-domain analysis; wavelet transforms; anisotropic dielectric material; dielectric cavity structures; multiresolution time domain analysis; resonant cavity structures; scaling functions; Boundary conditions; Dielectrics; Equations; Magnetic fields; Magnetic flux; Magnetic materials; Material properties; Resonance; Symmetric matrices; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.512309
  • Filename
    512309
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2273339