DocumentCode
2273820
Title
Statistical method of modeling and optimization for wireless sensor nodes with different interconnect technologies and substrates
Author
Zheng, Liqiang ; Mathewson, Alan ; O´Flynn, Brendan ; Hayes, Michael ; O´Mathuna, Cian
Author_Institution
Tyndall Nat. Inst., Cork, Ireland
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
860
Lastpage
865
Abstract
A comparison study was carried out between a wireless sensor node with a bare die flip-chip mounted and its reference board with a BGA packaged transceiver chip. The main focus is the return loss (S parameter S11) at the antenna connector, which was highly depended on the impedance mismatch. Modeling including the different interconnect technologies, substrate properties and passive components, was performed to simulate the system in Ansoft Designer software. Statistical methods, such as the use of standard derivation and regression, were applied to the RF performance analysis, to see the impacts of the different parameters on the return loss. Extreme value search, following on the previous analysis, can provide the parameters´ values for the minimum return loss. Measurements fit the analysis and simulation well and showed a great improvement of the return loss from -5dB to -25dB for the target wireless sensor node.
Keywords
ball grid arrays; flip-chip devices; integrated circuit interconnections; radiofrequency integrated circuits; regression analysis; transceivers; wireless sensor networks; Ansoft Designer software; BGA packaged transceiver chip; RF performance analysis; antenna connector; bare die flip-chip; impedance mismatch; interconnect technology; passive components; regression analysis; return loss; statistical method; substrate property; wireless sensor node modelling; Impedance matching; Integrated circuit modeling; Loss measurement; Optimization; Packaging; Radio frequency; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582406
Filename
5582406
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