• DocumentCode
    2275397
  • Title

    Preparation and characterization of Bi-perovskite oxide films for piezo applications

  • Author

    Yasui, Shintaro ; Naganuma, Hiroshi ; Okamura, Soichiro ; Iijima, Takashi ; Nishida, Ken ; Katoda, Takashi ; Uchida, Hiroshi ; Koda, Seiichiro ; Funakubo, Hiroshi

  • Author_Institution
    Tokyo Inst. of Technol., Yokohama
  • fYear
    2007
  • fDate
    27-31 May 2007
  • Firstpage
    102
  • Lastpage
    103
  • Abstract
    Thin films of BiFeO30-BiScO3 (BFO-BSO) solid-solution were fabricated for improving electrical resistivity of BiFeO3-based films by replacing electrically-unstable Fe3+ for stable Sc3+. The films with chemical composition of Bi(Fe1-x, Scx)O3 were fabricated on (111)Pt/TiO2/SiO2/(100)Si by chemical solution deposition technique. Single phase of perovskite was obtained in the range of x = 0-0.3, where selective replacement of Fe3+ and Sc3+ was confirmed by Raman measurement. The leakage current density of BFO-BSO film was reduced by increasing x. Well-saturated polarization -electric field hysteresis loop was obtained for BFO-BSO film with x = 0.15.
  • Keywords
    Raman spectra; bismuth compounds; crystal structure; dielectric hysteresis; dielectric polarisation; dielectric thin films; electrical resistivity; leakage currents; liquid phase epitaxial growth; BiFeO3-BiScO3; Pt-TiO2-SiO2-Si; Raman measurement; Si; chemical composition; chemical solution deposition technique; crystal structure; electric field hysteresis loop; electrical resistivity; leakage current density; perovskite oxide films; piezo applications; polarization; Chemical technology; Electronics industry; Ferroelectric films; Ferroelectric materials; Leakage current; Material storage; Materials science and technology; Piezoelectric films; Textile industry; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
  • Conference_Location
    Nara
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-1334-8
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2007.4393180
  • Filename
    4393180