Measurement of complex permittivity of dielectric materials in millimeter wave region by whispering gallery mode method

Author

Tamura, Hajime ; Kogami, Yoshinori ; Matsumura, Kazuhito

Author_Institution

Fac. of Eng., Utsunomiya Univ., Japan

Volume

3

fYear

2001

fDate

2001

Firstpage

1223

Abstract

A new and simple evaluation method for complex permittivity of dielectric materials in millimeter wave region is presented. The method is based on the Whispering Gallery mode (WG mode) resonance in a dielectric disk which is made of the material under test. The WG mode resonator system is constructed only by the dielectric disk with coupled dielectric waveguides, without any metallic parts. As a result, this system has no metallic dissipation. We can obtain highly accurate results for the evaluation of low-loss dielectric materials in the millimeter wave region. In this paper, we present the measuring principle of the complex permittivity, optimum dimensions of the test piece (disk diameter and thickness), measurement procedure and some examples of the measuring results in 50 to 110 GHz band

Keywords

dielectric resonators; millimetre wave measurement; permittivity measurement; 50 to 110 GHz; EHF; MM-wave measurement procedure; WG mode resonance; WG mode resonator system; complex permittivity; coupled dielectric waveguides; dielectric disk; dielectric materials; low-loss materials; millimeter wave region; whispering gallery mode resonance; Dielectric materials; Dielectric measurements; Materials testing; Millimeter wave measurements; Millimeter wave technology; Permittivity measurement; Resonance; Thickness measurement; Waveguide components; Whispering gallery modes;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific

Conference_Location

Taipei

Print_ISBN

0-7803-7138-0

Type

conf

DOI

10.1109/APMC.2001.985354

Filename

985354