• DocumentCode
    2276698
  • Title

    Two methods for improving electrochemical migration resistance of printed wiring boards

  • Author

    Ohki, Y. ; Hirose, Y. ; Wada, G. ; Asakawa, H. ; Tanaka, T. ; Maeno, T. ; Okamoto, K.

  • Author_Institution
    Fac. of Sci. & Eng., Waseda Univ., Tokyo, Japan
  • fYear
    2012
  • fDate
    17-20 Sept. 2012
  • Firstpage
    548
  • Lastpage
    552
  • Abstract
    Experiments were carried out using space charge distribution measurements as a major measurement method in order to find effective measures to suppress electrochemical migration (ECM) along the thickness direction of a printed wiring board (PWB). As a result, the following valuable knowledge was obtained. First, in a PWB consisting of paper/ phenol-resin composite and a copper electrode, the electrical resistivity of epoxy resin used as an adhesive layer to connect the composite and the electrode is usually higher than that of the composite. In such a case, ECM is easily grown in the PWB. The resistance against ECM was found to increase significantly if we use an adhesive layer with a similar electrical resistivity to the insulating material in a PWB. Another important fact is that the growth of ECM can be suppressed if silica nanofillers were added to epoxy resin in the case of an epoxy-based PWB.
  • Keywords
    adhesives; charge measurement; electrical resistivity; insulating materials; printed circuits; resins; ECM; PWB; adhesive layer; copper electrode; electrical resistivity; electrochemical migration resistance improvement; epoxy resin; insulating material; paper-phenol-resin composite; printed wiring boards; silica nanofillers; space charge distribution measurements; thickness direction; Anodes; Electric fields; Electronic countermeasures; Epoxy resins; Moisture; Space charge; Voltage measurement; electrochemical migration; printed wiring board;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2012 International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4673-4747-1
  • Type

    conf

  • DOI
    10.1109/ICHVE.2012.6357042
  • Filename
    6357042