• DocumentCode
    2278396
  • Title

    Bulk and Thick Film Processing of Non-Lead Piezoelectric Material

  • Author

    Kwon, Seongtae ; Hackenberger, Wes ; Zhan, Shujun ; Shrout, Thomas

  • Author_Institution
    TRS Technol. Inc., State College
  • fYear
    2007
  • fDate
    27-31 May 2007
  • Firstpage
    634
  • Lastpage
    637
  • Abstract
    Non lead piezoelectric materials with two compositions from the (BiNa)TiO3-(BiK)TiO3 -BaTiO3 system and one composition from the (KNa)NbO3-LiTaO3 system were synthesized using the mixed oxide technique. Piezoelectric and dielectric properties of bulk ceramics were measured and their sensitivity to moisture and poling conditions were compared to determine the optimum composition for thick film processing. The dielectric constants of bulk ceramics were 710~940 and d33´s were in the 130 -210 pC/N range. The composition of bulk ceramics that exhibited the best property durability was chosen for thick film screen printing. Processing parameters were optimized to achieve defect-free films. Dielectric loss and hysteresis in polarization were observed to be very sensitive to film quality and 9 mum thick films with compatible properties to bulk ceramics were achieved.
  • Keywords
    bismuth compounds; dielectric hysteresis; dielectric losses; dielectric polarisation; durability; lithium compounds; materials preparation; piezoceramics; potassium compounds; sodium compounds; thick films; BiNaTiO3-BiKTiO3-BaTiO3; KNaNbO3-LiTaO3; ceramics; dielectric constants; dielectric hysteresis; dielectric loss; dielectric properties; durability; mixed oxide technique; nonlead piezoelectric materials; optimum composition; polarization; poling conditions; thick film processing; thick film screen printing; Ceramics; Dielectric constant; Dielectric losses; Dielectric measurements; Lead compounds; Moisture measurement; Piezoelectric materials; Printing; Thick films; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
  • Conference_Location
    Nara
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-1334-8
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2007.4393352
  • Filename
    4393352