DocumentCode
2278754
Title
Reflection of plane wave from multi-layered dielectrics
Author
Thakur, K.P. ; Holmes, W.S.
Author_Institution
Electromagn. Sensing Imaging & Sensing, Ind. Res. Ltd., Auckland, New Zealand
Volume
2
fYear
2001
fDate
3-6 Dec. 2001
Firstpage
910
Abstract
This paper presents an easy to use method to estimate the reflection coefficients of plane electromagnetic wave incident upon multiple layers of dielectrics. By using an inverse technique, the thickness of the dielectric layer can be obtained from the measurements of reflection coefficients.
Keywords
dielectric thin films; electromagnetic wave reflection; inverse problems; multilayers; thickness measurement; dielectric layer thickness; inverse technique; multi-layered dielectrics; plane electromagnetic wave reflection coefficients; thickness determination; Dielectric measurements; Electromagnetic measurements; Electromagnetic reflection; Electromagnetic scattering; Equations; Frequency measurement; Fresnel reflection; Optical reflection; Polarization; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2001. APMC 2001. 2001 Asia-Pacific
Conference_Location
Taipei, Taiwan
Print_ISBN
0-7803-7138-0
Type
conf
DOI
10.1109/APMC.2001.985520
Filename
985520
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