• DocumentCode
    2279754
  • Title

    Microstructure and property of Sn-Zn-Cu-Bi lead free solder

  • Author

    Xiuzhong, Liu ; Min, Yang ; Xinghong, Liu ; Jiahui, Dai

  • Author_Institution
    Key Lab. of Liquid Struct. & Heredity of Mater. (Minist. of Educ.), Shandong Univ., Jinan, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    789
  • Lastpage
    793
  • Abstract
    Sn-Zn-Cu-Bi lead free solder is one of promising candidates to replace Sn-Pb eutectic solder because of its low cost, good wettability to Cu, low melt temperature and without toxicity. The microstructure and property of Sn-Zn-Cu-Bi lead free solder has been investigated in this paper. The wettability to Cu substrate of solders with different Bi concent was investigated by spread test. Solder melt temperature was tested by DSC themal analysis. Phases in solder joint were analyzed by x-ray diffraction (XRD). The microstructure of solder was observed by scanning electron microscope (SEM). The compositions of different phases in solder were tested through electron probe microanalysis (EPMA) and EDS. Strength of solder was evaluated by tensile test. Results show that Bi can improve solder wettability and reduce the melt temperature, but decrease the strength of solder. There are Sn and Bi solid solution, β - CuSn, CuZn in solder. No Zn solid solution exists in solder. CuZn phase appears as block in solder. Pure Bi and Sn-Bi eutectic phase present as lamellar texture in solder. CuZn2, η - Cu6Sn5, Cu5Zn8 and α - [Cu,Sn] intermetallic compounds appeare at interface.
  • Keywords
    X-ray diffraction; bismuth alloys; copper alloys; differential scanning calorimetry; electron probe analysis; melting; scanning electron microscopes; solders; tensile testing; tin alloys; wetting; zinc alloys; EDS; Sn-Zn-Cu-Bi; X-ray diffraction; differential scanning calorimetry themal analysis; electron probe microanalysis; eutectic solder; lead free solders; scanning electron microscope; solder melt temperature; solder wettability; tensile test; Bismuth; Compounds; Copper; Lead; Substrates; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582696
  • Filename
    5582696