• DocumentCode
    2279950
  • Title

    Improving signal integrity by optimal design of power/ground plane stack-up structure

  • Author

    Jin, Chiayu ; Chou, Chia-Hsing ; Li, Dian-rung ; Chuang, Tsung-ying

  • Author_Institution
    Adv. Semicond. Eng. Inc., Kaohsiung
  • fYear
    2006
  • fDate
    6-8 Dec. 2006
  • Firstpage
    853
  • Lastpage
    859
  • Abstract
    This paper focuses on the signal integrity due to non-ideal return path on multi-layer packages, such as normal BGA or flip-chip BGA. The main effect of non-ideal return path of a signal is that several resonant modes will be derived at specific frequencies, and these resonant modes will degrade the signal integrity depending on the location of non-ideal return path. The resonant characteristic is inherent in electronic packages that use solid power and ground planes because a pair of power/ground planes behaves like a resonant cavity with induced displacement currents from signal transitions or switching noise. In order to solve the problem mentioned above, stack-up of power/ground planes must be arranged carefully. Besides, adding proper amount of power/ground vias on proper locations can help to eliminate power/ground plane effect on signal trace. This paper discuss how the non-ideal return path affects signal integrity of signals in both strip-line and microstrip line, and try to find out a optimal stack-up design of a multi-layer package.
  • Keywords
    ball grid arrays; flip-chip devices; microstrip lines; printed circuits; electronic packages; flip-chip ball grid arrays; ground plane stack-up structure; microstrip line; multi-layer packages; non-ideal return path; resonant cavity; signal integrity; Analytical models; Degradation; Electromagnetic measurements; Frequency; Insertion loss; Packaging; Pins; Resonance; Scattering parameters; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
  • Conference_Location
    Singapore
  • Print_ISBN
    1-4244-0664-1
  • Electronic_ISBN
    1-4244-0665-X
  • Type

    conf

  • DOI
    10.1109/EPTC.2006.342824
  • Filename
    4147353