• DocumentCode
    2280162
  • Title

    Permeability and permittivity measurements using propagation and impedance of TRL calibrated microstriplines

  • Author

    Afsar, Mohammed N. ; McCooey, Sean ; Al-Moyaed, Nawaf ; Obol, Mahmut

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    528
  • Lastpage
    529
  • Abstract
    Numerous wireless communication devices such as integrated circuits and micro biochips are emerging in the 1 to 4 GHz frequency range. Thus it has become crucial to accurately determine the permeability and permittivity of such materials and devices in this spectral range. In this paper, we present a propagation and impedance technique for the microstripline. Three different substrates (Alumina, Silicon dioxide and Beryllium Oxide) are employed to design TRL sets for measurement purposes. The custom-designed TRL sets return losses of up to -50 dB which is the same as a standard waveguide TRL calibration.
  • Keywords
    alumina; beryllium compounds; calibration; electric impedance; magnetic permeability measurement; microstrip lines; permittivity measurement; silicon compounds; Al2O3; BeO; SiO2; TRL calibrated microstriplines; impedance; permeability measurements; permittivity measurements; propagation; return loss; Biological materials; Biomedical measurements; Dielectric measurements; Ferrites; Impedance; Measurement techniques; Microstrip; Nickel; Permeability measurement; Permittivity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574886
  • Filename
    4574886