DocumentCode
2283419
Title
Two ions in one trap: ultra-high precision mass spectrometry?
Author
Rainville, S. ; Thompson, J.K. ; Pritchard, D.E.
Author_Institution
Dept. of Phys., MIT, Cambridge, MA, USA
fYear
2002
fDate
16-21 June 2002
Firstpage
318
Lastpage
319
Abstract
By simultaneously trapping two different ions in a Penning trap, we compared their cyclotron frequencies (whose ratio gives their atomic mass ratio) with a precision of about 10/sup -11/ in only a few hours. Unfortunately we observed large abrupt changes in the ratio for which we do not have an explanation.
Keywords
atomic mass; mass spectra; mass spectroscopy; particle traps; trapped ions; Penning trap; abrupt ratio changes; atomic mass ratio; cyclotron frequencies; ion trapping; ultra-high precision mass spectrometry; Atomic measurements; Chemical processes; Cyclotrons; Fluctuations; Frequency measurement; Magnetic field measurement; Mass spectroscopy; Metrology; Neutrino sources; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034849
Filename
1034849
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