DocumentCode
2284081
Title
Extension of Swerlein´s algorithm for AC voltage measurement in the frequency domain
Author
Kyriazis, G.A.
Author_Institution
Normalizacao e Qualidade Ind., Instituto Nacional de Metrologia, Rio de Janeiro, Brazil
fYear
2002
fDate
16-21 June 2002
Firstpage
396
Lastpage
397
Abstract
A sampling algorithm that uses a high-resolution voltmeter for measuring the RMS value of a sinusoidal voltage waveform is presented. The technique is a modification of a previously described approach. In the new approach the RMS values of the specified harmonics are evaluated by a multiple linear regression algorithm.
Keywords
frequency-domain analysis; harmonic analysis; signal resolution; signal sampling; statistical analysis; voltage measurement; voltmeters; RMS harmonics; RMS sinusoidal voltage waveform value; Swerlein algorithm; frequency domain AC voltage measurement; high-resolution voltmeter; multiple linear regression algorithm; sampling algorithm; Apertures; Equations; Error correction; Frequency domain analysis; Frequency estimation; Frequency measurement; Frequency response; Sampling methods; Voltage measurement; Voltmeters;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034889
Filename
1034889
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