DocumentCode
2284128
Title
Extension of the IEN traceability for AC voltages below 200 mV
Author
Pogliano, U. ; Bosco, G.C. ; D´Elia, Vincenzo
Author_Institution
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
fYear
2002
fDate
16-21 June 2002
Firstpage
400
Lastpage
401
Abstract
The system, the standards and the procedures developed at IEN for the extension of the traceability to low voltage ranges down to 1 mV are described. Specific new features are the low voltage generator system, the procedures for building the traceability and the method for the evaluation of the load correction based on perturbations with known admittances.
Keywords
load regulation; measurement standards; perturbation techniques; voltage measurement; 1 mV; AC voltages; IEN procedures; IEN standards; IEN traceability extension; load correction evaluation; low voltage generator system; low voltage ranges; perturbation admittances; traceability; Analog-digital conversion; Batteries; Calibration; Inductors; Low voltage; Potentiometers; Resistors; Standards development; Switches; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034891
Filename
1034891
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