Polynomial chaos helps assessing parameters variations of PCB lines

This paper presents an effective solution for the analysis of long PCB interconnects with the inclusion of uncertainties resulting from different sources of variation, like temperature or fabrication process, on both the structure and loading conditions. The proposed approach is based on the expansion of the well-known frequency-domain telegraph equations in terms of orthogonal polynomials. The method is validated by means of a systematic comparison with the results of Monte Carlo simulations, for an application example involving a coupled-microstrip interconnect on PCB.