• DocumentCode
    2284400
  • Title

    EMD and psychoacoustic model based watermarking for audio

  • Author

    Wang, Liang ; Emmanuel, Sabu ; Kankanhalli, Mohan S.

  • Author_Institution
    Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    19-23 July 2010
  • Firstpage
    1427
  • Lastpage
    1432
  • Abstract
    The audio watermarking method proposed in this paper offers the copyright protection to an audio without the use of the original signal for watermark detection. The analysis filterbank decomposition, the psychoacoustic model and the empirical mode decomposition (EMD) are the three key techniques used in the novel audio watermarking method. Unlike the traditional audio watermarking algorithms where the watermark bits are embedded directly in the signal either by time domain or transform domain processing, the novel blind audio watermarking algorithm proposed in this paper embeds the watermark bits in the final residue of the subbands in the transform domain. Four watermark messages are embedded into the proposed audio watermarking system. The inaudibility, capacity and robustness of the audio watermarking system are evaluated, in order to optimize the system performance. The experimental results show that the proposed blind watermarking scheme is robust against MP3 compression and adding Gaussian noise attacks.
  • Keywords
    Gaussian noise; audio signal processing; watermarking; EMD; Gaussian noise attacks; MP3 compression; blind audio watermarking algorithm; copyright protection; empirical mode decomposition; filterbank decomposition; psychoacoustic model; time domain processing; transform domain processing; watermark detection; Bit error rate; Filter bank; Phase change materials; Psychoacoustic models; Robustness; Transforms; Watermarking; Blind audio watermarking; analysis filterbank decomposition; empirical mode decomposition (EMD); psychoacoustic model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo (ICME), 2010 IEEE International Conference on
  • Conference_Location
    Suntec City
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-4244-7491-2
  • Type

    conf

  • DOI
    10.1109/ICME.2010.5582957
  • Filename
    5582957