• DocumentCode
    2285822
  • Title

    Cell-cell adhesion force measurement using nano picker via nanorobotic manipulators inside ESEM

  • Author

    Shen, Yajing ; Ahmad, Mohd Ridzuan ; Nakajima, Masahiro ; Kojima, Seiji ; Homma, Michio ; Fukuda, Toshio

  • Author_Institution
    Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya, Japan
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    870
  • Lastpage
    874
  • Abstract
    Cell-cell adhesion force is important for cell activities. In this paper, a novel cell-cell adhesion force measurement method using nano picker was proposed based on the nanorobotic manipulation system inside an environmental scanning electron microscopy (ESEM). The nano picker was fabricated from atomic force microscopy(AFM) cantilever by focused ion beam(FIB) etching. The spring constant of the nano picker was calibrated by nano manipulation approach. The cell which was selected for adhesion force measurement was first positioned on the top of another cell by a micro probe. Then, the nano picker was inserted to the join area between the two cells. Finally, the nano picker lifted the top cell by the actuating of nano manipulator inside environmental scanning electron microscopy ESEM. The cell-cell adhesion force can be measured based on the deflection of the cantilever during the cell separation. This method allowed the observation and manipulation of cell at nano scale simultaneously. Study of cell adhesion will benefit the understanding the mechanism of cell spreading, proliferation and so on.
  • Keywords
    adhesion; atomic force microscopy; biomechanics; cellular biophysics; focused ion beam technology; force measurement; manipulators; nanobiotechnology; nanomechanics; scanning electron microscopy; sputter etching; AFM; ESEM; FIB etching; atomic force microscopy; cell spreading; cell-cell adhesion; environmental scanning electron microscopy; focused ion beam; force measurement; nanopicker; nanorobotic manipulators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697834
  • Filename
    5697834