A novel algorithm for the restoration of AFM/STM images

Author

Yu, Tian-Hu ; Mitra, Sanjit K.

Author_Institution

Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong

fYear

1994

fDate

13-16 Apr 1994

Firstpage

784

Abstract

Images generated from the scanning tunneling microscope (STM) or atomic force microscope (AFM) imaging system can show microstructures of samples. However, resulting AFM/STM images are sometimes corrupted by streaks. Thus, to suppress such streaks becomes an important task in the processing of AFM/STM images. We analyze the generation of streaks, introduce a degradation model of the corrupted AFM/STM image, and then propose an adaptive notch filtering algorithm to remove the streaks. Some simulation results support the analysis and indicate the performance of the proposed algorithm

Keywords

adaptive filters; digital filters; image reconstruction; notch filters; scanning electron microscope examination of materials; AFM/STM images; adaptive notch filtering algorithm; atomic force microscope; degradation model; image restoration; imaging system; microstructures; performance; samples; scanning tunneling microscope; simulation results; streaks suppression; Algorithm design and analysis; Analytical models; Atomic force microscopy; Degradation; Filtering algorithms; Image analysis; Image generation; Image restoration; Microstructure; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Speech, Image Processing and Neural Networks, 1994. Proceedings, ISSIPNN '94., 1994 International Symposium on

Print_ISBN

0-7803-1865-X

Type

conf

DOI

10.1109/SIPNN.1994.344794

Filename

344794