DocumentCode
2287648
Title
Binary diversity for non-binary LDPC codes over the Rayleigh channel
Author
Gorgoglione, Matteo ; Savin, Valentin ; Declercq, David
Author_Institution
CEA-LETI, Grenoble, France
fYear
2012
fDate
1-4 April 2012
Firstpage
158
Lastpage
162
Abstract
In this paper we analyze the performance of several bit-interleaving strategies applied to Non-Binary Low-Density Parity-Check (LDPC) codes over the Rayleigh fading channel. The technique of bit-interleaving used over fading channel introduces diversity which could provide important gains in terms of frame error probability and detection. This paper demonstrates the importance of the way of implementing the bit-interleaving, and proposes a design of an optimized bit-interleaver inspired from the Progressive Edge Growth algorithm. This optimization algorithm depends on the topological structure of a given LDPC code and can also be applied to any degree distribution and code realization. In particular, we focus on non-binary LDPC codes based on graph with constant symbol-node connection dv = 2. These regular (2, dc)-NB-LDPC codes demonstrate best performance, thanks to their large girths and improved decoding thresholds growing with the order of Finite Field. Simulations show excellent results of the proposed interleaving technique compared to the random interleaver as well as to the system without interleaver.
Keywords
Rayleigh channels; diversity reception; error statistics; optimisation; parity check codes; Rayleigh fading channel; binary diversity; bit-interleaving strategies; constant symbol-node connection; frame error probability; nonbinary LDPC codes; nonbinary low-density parity-check codes; optimization algorithm; progressive edge growth algorithm; Algorithm design and analysis; Decoding; Error analysis; Modulation; Parity check codes; Rayleigh channels; Non-binary LDPC codes; Rayleigh fading channel; Tanner Graph; bit-interleaver;
fLanguage
English
Publisher
ieee
Conference_Titel
Wireless Communications and Networking Conference (WCNC), 2012 IEEE
Conference_Location
Shanghai
ISSN
1525-3511
Print_ISBN
978-1-4673-0436-8
Type
conf
DOI
10.1109/WCNC.2012.6214035
Filename
6214035
Link To Document