• DocumentCode
    2288147
  • Title

    Learning long term face aging patterns from partially dense aging databases

  • Author

    Suo, Jinli ; Chen, Xilin ; Shan, Shiguang ; Gao, Wen

  • Author_Institution
    Grad. Univ. of Chinese Acad. of Sci. (CAS), Beijing, China
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    622
  • Lastpage
    629
  • Abstract
    Studies on face aging are handicapped by lack of long term dense aging sequences for model training. To handle this problem, we propose a new face aging model, which learns long term face aging patterns from partially dense aging databases. The learning strategy is based on two assumptions: (i) short term face aging pattern is relatively simple and is possible to be learned from currently available databases; (ii) long term face aging is a continuous and smooth Markov process. Adopting a compositional face representation, our aging algorithm learns a function-based short term aging model from real aging sequences to infer facial parameters within a short age span. Based on the predefined smoothness criteria between two overlapping short term aging patterns, we concatenate these learned short term aging patterns to build the long term aging patterns. Both the subjective assessment and objective evaluations of synthetic aging sequences validate the effectiveness of the proposed model.
  • Keywords
    Markov processes; face recognition; image representation; image sequences; learning (artificial intelligence); visual databases; Markov process; face aging model; face representation; handicapped; learning strategy; model training; objective evaluations; real aging sequences; smoothness criteria; subjective assessment; Aging; Biological system modeling; Computer vision; Content addressable storage; Databases; Deformable models; Face detection; Muscles; Prototypes; Skin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459181
  • Filename
    5459181