• DocumentCode
    2290015
  • Title

    Built-in-test adequacy-evaluation methodology for an air-vehicle system

  • Author

    Beniquez, Dario R. ; Witteried, David C.

  • Author_Institution
    USAF, Edwards AFB, CA, USA
  • fYear
    1995
  • fDate
    16-19 Jan 1995
  • Firstpage
    290
  • Lastpage
    295
  • Abstract
    Rapid improvement in built-in-test (BIT) system capability is probably one of the most important activities in an air-vehicle system development test and evaluation program. An effective BIT adequacy evaluation methodology can accomplish this. The methodology must provide the development tester BIT parameters that serve as indicators of air-vehicle BIT system performance. Deficiencies that are pinpointed can then be corrected to improve the overall BIT system´s performance. A BIT adequacy evaluation methodology developed and implemented during a recently conducted Air Force development and test program did just that. It provided real-time technical information at a particular period that indicated the status of the BIT system in relation to specified requirements. It also served as a springboard to evaluate the BIT system, and to document the results, which provided the manufacturer with valuable data on the BIT system´s performance. Finally, it gave the manufacturer the opportunity to implement corrective actions within the allocated schedule, and develop the air-vehicle BIT system concurrently
  • Keywords
    aerospace computing; aircraft; aircraft testing; built-in self test; computerised instrumentation; reliability; Air Force; adequacy evaluation methodology; aircraft reliability; built-in-test; development; performance; real-time; test program; Fault detection; Hardware; Job shop scheduling; Manufacturing; Personnel; Real time systems; Software testing; System performance; System testing; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1995. Proceedings., Annual
  • Conference_Location
    Washington, DC
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-2470-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1995.513260
  • Filename
    513260