• DocumentCode
    2292685
  • Title

    Convergence properties of relaxation methods in the DC analysis of large MOS circuits

  • Author

    Knopman, J. ; Mesquita, A. ; Schechtman, J.

  • Author_Institution
    Dept. of Electr. Eng., Fed. Univ. of Rio de Janeiro, Brazil
  • fYear
    1988
  • fDate
    7-9 Jun 1988
  • Firstpage
    1639
  • Abstract
    A novel approach, formulated as a special case of transient analysis is proposed for the DC analysis problem. This makes it possible to rely on a common background in both instances. Simulation results for the DC analysis of MOS circuits are compared with those obtained by the standard circuit simulator SPICE
  • Keywords
    MOS integrated circuits; circuit analysis computing; convergence of numerical methods; DC analysis of large MOS circuits; convergence; relaxation methods; transient analysis; Analytical models; Capacitance; Circuit simulation; Convergence; Equations; Gaussian processes; MOS capacitors; Performance analysis; Relaxation methods; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1988., IEEE International Symposium on
  • Conference_Location
    Espoo
  • Type

    conf

  • DOI
    10.1109/ISCAS.1988.15248
  • Filename
    15248