• DocumentCode
    2301622
  • Title

    High performance CMOS array with an embedded test structure

  • Author

    Pierce, Kerry ; Lipp, Robert ; Chan, Eric ; Wong, Tony

  • Author_Institution
    CrossCheck Technol. Inc., San Jose, CA, USA
  • fYear
    1990
  • fDate
    13-16 May 1990
  • Abstract
    A compacted array containing the CrossCheck embedded test structure has been jointly developed by LSI Logic Corporation and CrossCheck Technology. A test device was built and the embedded test structure was found to successfully collect internal logic node values without disturbing internal logic values. The CrossCheck test structure used a minimum of area in the array and had no observable impact on the test chip logic operating speed
  • Keywords
    CMOS integrated circuits; application specific integrated circuits; integrated circuit testing; logic arrays; logic testing; ASIC testing; CMOS array; CrossCheck; LSI Logic Corporation; compacted array; embedded test structure; internal logic node values; Application specific integrated circuits; Circuit faults; Circuit testing; Integrated circuit testing; Large scale integration; Logic arrays; Logic devices; Logic testing; Probes; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990
  • Conference_Location
    Boston, MA
  • Type

    conf

  • DOI
    10.1109/CICC.1990.124656
  • Filename
    124656
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2301622