• DocumentCode
    2302585
  • Title

    Modeling Breakdown Processes in RF Cavities Using Particle-in-cell (PIC) Codes

  • Author

    Mahalingam, Sudhakar ; Veitzer, Seth A. ; Stoltz, Peter H.

  • Author_Institution
    Tech-X Corp., Boulder, CO
  • fYear
    2008
  • fDate
    27-31 May 2008
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    Design of future accelerators can benefit from the use of high gradient RF electric fields (>50 MV/m) and operating under strong applied magnetic fields (>2.5 T). These large fields help to minimize the number of costly accelerating elements needed for the neutrino experiments. However a main limitation in applying such large fields in the design of accelerators is the physical breakdown of metallic structures. We have developed computer models of the process of breakdown using OOPIC Pro, a 2-dimensional particle-in-cell (PIC) code in order to understand the physical processes that are responsible for breakdown and test methodologies to mitigate the problem. We describe here the results of our numerical experiments including the effects of applied magnetic field strength and direction on the breakdown process, sensitivity of breakdown triggers on field emission parameters, and the potential to measure the onset of breakdown by examining impurity radiation.
  • Keywords
    electric breakdown; electromagnetic fields; RF cavities; applied magnetic fields; breakdown process; high gradient RF electric fields; metallic structures physical breakdown; neutrino experiments; particle-in-cell codes; Acceleration; Accelerator magnets; Electric breakdown; Magnetic field measurement; Magnetic fields; Neutrino sources; Particle accelerators; Physics computing; Radio frequency; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
  • Conference_Location
    Las Vegas, NE
  • Print_ISBN
    978-1-4244-1534-2
  • Electronic_ISBN
    978-1-4244-1535-9
  • Type

    conf

  • DOI
    10.1109/IPMC.2008.4743640
  • Filename
    4743640