• DocumentCode
    2303946
  • Title

    Enhanced Identification of Strong Robustly Testable Paths

  • Author

    Flanigan, Edward ; Tragoudas, Spyros

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Southern Illinois Univ. at Carbondale, IL
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    729
  • Lastpage
    736
  • Abstract
    Strong robustly sensitizable paths play an essential role in determining circuit timing characteristics as well as defining delay fault diagnosis resolution. A novel technique is presented that increases the number of strong robustly sensitizable path delay faults (PDFs) through validation. Experimental results show that the proposed strong robust validation technique significantly improves the number of strong robustly sensitizable PDFs therefore increases diagnosis resolution and improves the ability to correctly determine circuit timing characteristics
  • Keywords
    fault diagnosis; integrated circuit testing; timing; circuit timing characteristics; delay fault diagnosis resolution; strong robust validation technique; strong robustly sensitizable path delay faults; strong robustly testable paths; Automatic testing; Circuit faults; Circuit testing; Delay; Electronic equipment testing; Equations; Fault diagnosis; Performance evaluation; Robustness; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.73
  • Filename
    4149121