DocumentCode
2304425
Title
Modelling of ICA creep properties
Author
Rusanen, Outi
Author_Institution
VTT Electron., Oulu, Finland
fYear
2000
fDate
2000
Firstpage
194
Lastpage
198
Abstract
Flip chip bonding with isotropically conducting adhesives is gaining in popularity since it can simplify and reduce the cost of the interconnecting process. To effectively estimate the reliability of ICA flip chip joints, one needs to model the viscoelastic behaviour of the adhesives. Creep is an important property because it enables stress relaxation through non-recoverable strain. Ignoring ICA creep in FE-simulations will result in overestimation of stress and underestimation of strain in a joint. This paper proposes that ICAs can be modelled as a Maxwell element to calculate creep compliance rates. The creep compliance rates are needed for simulating stress-strain hysteresis curves during a thermal cycle. The calculated non-recoverable creep strains are also used to estimate the fatigue lifetime of a joint. Results suggest that the lifetime of ICA joints is influenced less by non-recoverable strain than the lifetime of tin-lead solder joints
Keywords
adhesives; conducting polymers; creep; fatigue; finite element analysis; flip-chip devices; stress-strain relations; viscoelasticity; FE-simulations; ICA; Maxwell element; compliance rates; conducting polymers; creep properties; fatigue lifetime; flip chip bonding; flip chip joints; isotropically conducting adhesives; nonrecoverable creep strains; stress relaxation; stress-strain hysteresis curves; thermal cycle; viscoelastic behaviour; Bonding; Capacitive sensors; Costs; Creep; Elasticity; Flip chip; Hysteresis; Independent component analysis; Thermal stresses; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
Conference_Location
Espoo
Print_ISBN
0-7803-6460-0
Type
conf
DOI
10.1109/ADHES.2000.860597
Filename
860597
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