• DocumentCode
    2304425
  • Title

    Modelling of ICA creep properties

  • Author

    Rusanen, Outi

  • Author_Institution
    VTT Electron., Oulu, Finland
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    194
  • Lastpage
    198
  • Abstract
    Flip chip bonding with isotropically conducting adhesives is gaining in popularity since it can simplify and reduce the cost of the interconnecting process. To effectively estimate the reliability of ICA flip chip joints, one needs to model the viscoelastic behaviour of the adhesives. Creep is an important property because it enables stress relaxation through non-recoverable strain. Ignoring ICA creep in FE-simulations will result in overestimation of stress and underestimation of strain in a joint. This paper proposes that ICAs can be modelled as a Maxwell element to calculate creep compliance rates. The creep compliance rates are needed for simulating stress-strain hysteresis curves during a thermal cycle. The calculated non-recoverable creep strains are also used to estimate the fatigue lifetime of a joint. Results suggest that the lifetime of ICA joints is influenced less by non-recoverable strain than the lifetime of tin-lead solder joints
  • Keywords
    adhesives; conducting polymers; creep; fatigue; finite element analysis; flip-chip devices; stress-strain relations; viscoelasticity; FE-simulations; ICA; Maxwell element; compliance rates; conducting polymers; creep properties; fatigue lifetime; flip chip bonding; flip chip joints; isotropically conducting adhesives; nonrecoverable creep strains; stress relaxation; stress-strain hysteresis curves; thermal cycle; viscoelastic behaviour; Bonding; Capacitive sensors; Costs; Creep; Elasticity; Flip chip; Hysteresis; Independent component analysis; Thermal stresses; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
  • Conference_Location
    Espoo
  • Print_ISBN
    0-7803-6460-0
  • Type

    conf

  • DOI
    10.1109/ADHES.2000.860597
  • Filename
    860597