• DocumentCode
    2305032
  • Title

    Overshoot and Undershoot Control for Signal Generator

  • Author

    Lin, Hui ; Wu, Liming ; Liu, Junxiu ; Wen, Tengteng

  • Author_Institution
    Fac. of Inf. Eng., Guangdong Univ. of Technol., Guangzhou, China
  • Volume
    2
  • fYear
    2010
  • fDate
    13-14 March 2010
  • Firstpage
    864
  • Lastpage
    867
  • Abstract
    In this paper, properties of overshoot and undershoot as functions of circuit parameters are investigated. We establish transient analysis circuit model for the test conditions of signal generator, then analyze the overshoot and undershoot by this model, and point out they are mainly related to the distributed inductance, resistance, and the loading capacitance of circuits. Three comparative tests are designed to verify the above analysis. Finally, three kinds of solutions are derived. They are reducing the distributed inductance of lines, increasing the loading capacitance, and the resistance of lines. In which, the method of increasing resistance of lines, adding an appropriate resistance between signal generator port and a load, is the optimum solution, which is a trade-off between the overshoot peak voltage and the rise time. In addition, at the beginning of this paper, a brief introduction for the SOPC technique, the DDS technique, and the construction of signal generator by these two techniques is given.
  • Keywords
    VLSI; field programmable gate arrays; logic design; optimal control; signal generators; system-on-chip; transient analysis; SOPC technique; circuit parameter function; distributed inductance; loading capacitance; optimum solution; overshoot control; signal generator; system on programmable chip; transient analysis circuit model; undershoot control; Capacitance; Circuit testing; Design methodology; Embedded system; Field programmable gate arrays; Hardware; Inductance; Microprocessors; Signal design; Signal generators; overshoot; signal generator; undershoot;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
  • Conference_Location
    Changsha City
  • Print_ISBN
    978-1-4244-5001-5
  • Electronic_ISBN
    978-1-4244-5739-7
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2010.681
  • Filename
    5460133