DocumentCode
2306842
Title
New metal board for COB, Multi-Chip Module, TAB and Phlip-Chip
Author
Okuno, Atsushi ; Oyama, Noritaka ; Hashimoto, Tsunekazu ; Kinoshita, Hiroshi ; Shida, Hiroshi
Author_Institution
Japan Rec Co. Ltd., Osaka, Japan
fYear
1993
fDate
1-4 Jun 1993
Firstpage
555
Lastpage
559
Abstract
Recently, the use of high-density mounting and multi-function design have been rapidly progressing on the industry. For metal board, the chip on board (COB) method has been widely employed with which a silicon chip is directly connected to a metal board by use of the wire bonding method. However, conventional metal boards are insufficient with respect to reliability. We have succeeded in the development of metal board having a high reliability by using a compound material high-purity, of a high-function naphthalene epoxy resin and an aramid paper from PPODTA (Co-poly-paraphenylene 3,4-oxydiphenylene terephthalamide) for its insulating layer which is the most important part with respect to reliability. The metal board is excellent in heat resistance and heat dissipation, and particularly in migration resistance. Its coefficient of linear expansion is 6 ppm board can be expected to be applied for advanced surface mounting technologies, such as LCCC, COB, Flip Chip, PGA, MCM (Multi Chip Module) and TAB. These applications are automobiles, air conditioners, air craft, space satellite, rocket and small-sized motors
Keywords
circuit reliability; flip-chip devices; multichip modules; printed circuit manufacture; surface mount technology; tape automated bonding; COB; Flip Chip; LCCC; Multi-Chip Module; PGA; PPODTA; Si; TAB; aramid paper; co-poly-paraphenylene 3,4-oxydiphenylene terephthalamide; coefficient of linear expansion; heat dissipation; heat resistance; high-density mounting; insulating layer; metal board; migration resistance; multi-function design; naphthalene epoxy resin; reliability; silicon chip; surface mounting technologies; wire bonding; Bonding; Epoxy resins; Inorganic materials; Insulation; Materials reliability; Resistance heating; Silicon; Space technology; Surface resistance; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location
Orlando, FL
Print_ISBN
0-7803-0794-1
Type
conf
DOI
10.1109/ECTC.1993.346790
Filename
346790
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