Multiple calibration method for high frequency surface current measurements

There are many methods to measure EM fields. A small dipole antenna has been used for E-field measurements, and loop probe for H-field measurements (Carobbi et al., 2000; Whiteside and King, 1964). In recent times, since the problems for EMI by intended high power microwave have been increased, it is needed more accurate and wideband probe. In this paper, we will propose improvements for high frequency calibration method and probe characteristics. Above all, high frequency measurements error is higher than low frequency measurements. So we have to be decided probe effect for accuracy result by measurements. From this paper, we can find more common probe factor for used probe. To reduce measurements error, a multiple probe factor will be defined.