• DocumentCode
    2308179
  • Title

    Reverse-bias screening of large-area GaAs/Ge solar cells at low and high temperatures

  • Author

    Rosenberg, L.A. ; Gasner, S.H.

  • Author_Institution
    Lockheed Missiles & Space Co., Inc. Sunnyvale, CA, USA
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    1421
  • Lastpage
    1425
  • Abstract
    This paper presents the results of a series of reverse-bias tests performed by Lockheed Missiles and Space Company (LMSC). The purpose of the tests was twofold: to investigate the reverse-bias behavior of large-area (~4 cm×4.5 cm) gallium arsenide on germanium (GaAs/Ge) solar cells over a broad temperature regime, and to determine the most severe operating conditions within this regime in order to develop an effective production screening test. The tests were conducted in two phases. The first consisted of high-temperature (+93°C) reverse-bias screens and a high-temperature (+93°C) soak and cycling. The second set of tests included comparative reverse-bias screening at high (+93°C), low (-80°C), and room temperature, and a low-temperature reverse-bias soak. Dark I-V curves were taken at all three temperatures. The results of these tests show that the high-temperature test identifies susceptible cells more readily than the lower-temperature tests, though yields were close to 100% in all cases. The results confer a high level of confidence in the large-area GaAs/Ge cell to meet reverse-bias criteria for missions with stringent temperature and performance requirements
  • Keywords
    III-V semiconductors; elemental semiconductors; gallium arsenide; germanium; semiconductor device testing; solar cells; -80 to 93 C; GaAs-Ge; Lockheed Missiles and Space Company; dark I-V curves; high-temperature; large-area GaAs/Ge solar cells; low-temperature reverse-bias soak; production screening test; reverse-bias screening; severe operating conditions; Gallium arsenide; Germanium; Missiles; Performance evaluation; Photovoltaic cells; Production; Shadow mapping; Temperature; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.346908
  • Filename
    346908