• DocumentCode
    2310107
  • Title

    Machine protection system (MPS) for the XFEL

  • Author

    Karstensen, Sven ; Sheviakov, Igor ; Fröhlich, Lars ; Rehlich, Kay ; Staack, Martin ; Vetrov, Petr

  • fYear
    2009
  • fDate
    10-15 May 2009
  • Firstpage
    16
  • Lastpage
    21
  • Abstract
    For the operation of a machine like the 3 km long linear accelerator XFEL at DESY Hamburg, a safety system keeping the beam from damaging components is obligatory. This machine protection system (MPS) must detect failures of the RF system, magnets, and other critical components in various sections of the XFEL as well as monitor beam and dark current losses, and react in an appropriate way by limiting average beam power, dumping parts of the macropulse, or-in the worst case-shutting down the whole accelerator. It has to consider the influence of various machine modes selected by the timing system. The MPS provides the operators with clear indications of error sources, and offers the possibility to mask any input channel to facilitate the operation of the machine. In addition, redundant installation of critical MPS components will help to avoid unneccessary downtime. This document summarizes the requirements on the machine protection system and includes plans for its architecture and for needed hardware components.
  • Keywords
    accelerator RF systems; accelerator magnets; electron beams; free electron lasers; linear accelerators; particle beam bunching; DESY; RF system; X-ray free electron laser; XFEL; accelerator magnets; beam monitoring; critical components; dark current loss; dumping; electron beam bunching; error sources; hardware components; linear accelerator; machine protection system; Accelerator magnets; Condition monitoring; Dark current; Hardware; Linear accelerators; Particle beams; Power system protection; Radio frequency; Safety; Timing; AMC; ATCA; BLM; DESY; DOOCS; ILC; MPS; XFEL;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real Time Conference, 2009. RT '09. 16th IEEE-NPSS
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4454-0
  • Type

    conf

  • DOI
    10.1109/RTC.2009.5321807
  • Filename
    5321807