• DocumentCode
    2310346
  • Title

    Analysis of circular cluster tools: Transient behavior and semiconductor equipment models

  • Author

    Ahn, Younghun ; Morrison, James R.

  • Author_Institution
    Dept. of Ind. & Syst. Eng., KAIST, Daejeon, South Korea
  • fYear
    2010
  • fDate
    21-24 Aug. 2010
  • Firstpage
    39
  • Lastpage
    44
  • Abstract
    A cluster tool consists of a collection of wafer processing chambers housed in a chassis about a wafer transport robot. Cluster tools are of increasing importance in semiconductor wafer manufacturing. While much effort has been focused on the modeling and optimization of such tools in steady state, less attention has been paid to transient modeling. It is anticipated that there will be smaller lot sizes, more product changeovers and an increase in setups brought about by the transition to 450mm wafer diameters and product customization. As such, transient behavior may become the norm rather than the exception. In this paper we conduct a rigorous analysis of the cycle time of wafers that includes transient behavior, diverse process times and robot movement. The results extend existing analyzes, provide justification of existing approximations and allow us to develop more expressive and simple approximations for the cycle time. The models, which include the robot as a resource, can be used to replace the common affine Ax+B tool model in fab level simulations. A study of the quality and computational complexity of various transient models is conducted.
  • Keywords
    computational complexity; industrial robots; integrated circuit manufacture; production equipment; circular cluster tools; computational complexity; semiconductor equipment models; semiconductor wafer manufacturing; transient behavior models; wafer processing chambers; wafer transport robot; Approximation methods; Computational modeling; Equations; Robots; Semiconductor device modeling; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2010 IEEE Conference on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-5447-1
  • Type

    conf

  • DOI
    10.1109/COASE.2010.5584530
  • Filename
    5584530