• DocumentCode
    2310889
  • Title

    Adopting a customer-focused team approach to amorphous silicon multijunction module R&D

  • Author

    Peterson, Terry M. ; Luft, Werner

  • Author_Institution
    Electr. Power Res. Inst., Palo Alto, CA, USA
  • fYear
    1993
  • fDate
    10-14 May 1993
  • Firstpage
    950
  • Lastpage
    954
  • Abstract
    Informed observers of energy markets now generally believe that photovoltaics (PV) will not significantly penetrate the utility bulk-power sector before price and performance approach $50/m2 for 15% efficient modules in flat-plate systems. Progress toward such “utility grade” modules using amorphous thin films has been slow. The important amorphous thin-film research issues have been well known for some years. These have not been promptly and conclusively addressed, at least in part because of inadequate PV industry involvement in academic research. In view of this situation, the authors modified their research programs seeking to improve the efficiency of amorphous silicon PV research, conclusively address the key issues, and accelerate commercial introduction of utility-grade products. They began this by seeking “customer” (PV industry) specification of research priorities and forming mission-oriented teams to pursue the high-priority issues (customer requirements). This paper describes the process and results to date
  • Keywords
    amorphous semiconductors; elemental semiconductors; research and development management; silicon; solar cells; PV industry; R&D; Si; amorphous silicon multijunction solar cells; amorphous thin films; customer-focused team approach; flat-plate systems; mission-oriented teams; research priorities; utility bulk-power sector; utility-grade products; Acceleration; Amorphous materials; Amorphous silicon; Laboratories; Manufacturing; Material properties; Production; Renewable energy resources; Research and development; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    0-7803-1220-1
  • Type

    conf

  • DOI
    10.1109/PVSC.1993.347092
  • Filename
    347092