• DocumentCode
    2312150
  • Title

    An effective secondary electron emission suppression treatment for copper MDC electrodes

  • Author

    Curren, A.N. ; Long, K.J. ; Jensen, K.A. ; Roman, R.F.

  • Author_Institution
    NASA Lewis Res. Center, Cleveland, OH, USA
  • fYear
    1993
  • fDate
    5-8 Dec. 1993
  • Firstpage
    777
  • Lastpage
    780
  • Abstract
    Untreated oxygen-free, high-conductivity (OFHC) copper, commonly used for MDC electrodes, exhibits relatively high secondary electron emission characteristics. This paper describes a specialized ion-bombardment procedure for texturing copper surfaces which sharply reduces the emission properties relative to untreated copper. The resulting surface is a particle-free, robust, uniformly highly-textured all-metal structure. The use of this process requires no modifications to copper machining, brazing, or other MDC normal fabrication procedures. The flight TWT for a planned NASA deep space probe, the Cassini Mission, will incorporate copper MDC electrodes treated with the method described here.<>
  • Keywords
    copper; electrodes; ion beam effects; secondary electron emission; space vehicles; surface treatment; travelling-wave-tubes; Cassini Mission; Cu; MDC electrodes; NASA deep space probe; OFHC; all-metal structure; fabrication; flight TWT; ion-bombardment; multistage depressed collector; oxygen-free high-conductivity copper; secondary electron emission suppression treatment; surface texturing; Copper; Electrodes; Electron emission; Fabrication; Machining; NASA; Robustness; Space missions; Surface texture; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1993. IEDM '93. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-1450-6
  • Type

    conf

  • DOI
    10.1109/IEDM.1993.347198
  • Filename
    347198