Measuring distribution of carrier trap energy state density at interface of dielectric with step pressure wave method

Author

Yewen, Zhang ; Baitun, Yang ; Demin, T.U. ; Yaonan, Liu

Author_Institution

Dept. of Electr. Eng., Xi´´an Jiaotong Univ., China

fYear

1989

fDate

29 Oct-2 Nov 1989

Firstpage

303

Lastpage

308

Abstract

The space charge at the interface of FEP-PMMA (fluorinated ethylene propylene-polymethyl methacrylate) is measured by the step pressure wave method, and the relationship between the space charge and its discharge time at room temperature is studied. Considering the dynamic process of the carrier jumping out of the trap at the interface, it is possible to determine the carrier trap energy state density distribution at the interface. It is concluded that information about carrier traps in dielectric materials can be obtained by this technique

Keywords

contact potential; electron traps; electronic density of states; hole traps; interface electron states; organic insulating materials; polymers; space charge; FEP-PMMA interface; carrier trap energy state density distribution; dielectric materials; discharge time; dynamic process; fluorinated ethylene propylene-polymethyl methacrylate; potential distribution; space charge; step pressure wave method; Charge measurement; Current measurement; Density measurement; Dielectric materials; Energy measurement; Energy states; Pressure measurement; Space charge; Temperature; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on

Conference_Location

Leesburg, VA

Type

conf

DOI

10.1109/CEIDP.1989.69563

Filename

69563