• DocumentCode
    2314260
  • Title

    Membrane modeling of pull-in instability in MEMS sensors and actuators

  • Author

    Yang, Fuqian

  • Author_Institution
    Dept. of Chem. & Mater. Eng., Kentucky Univ., Lexington, KY, USA
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1199
  • Abstract
    The pull-in behavior of a conductive elastic membrane over a rigid ground electrode as a prototype of MEMS pressure sensors or MEMS microvalves is studied. Elastic membrane theory is used to describe the deformation of the membrane, which together with electric loading forms a nonlinear electromechanical coupling problem. A closed-form solution on the deflection of the membrane has been obtained, in which both equilibrium and non-equilibrium states are observed The transition from the equilibrium state to the non-equilibrium state is related to the stiction failure mode occurring in the operation of MEMS devices. Defined as the electric potential difference between the membrane and the electrode at which the snap-through of the membrane to the electrode occurs, the pull-in electric voltage is derived in a closed form. It is proportional to the square root of the tensile force created in the stretch of the membrane and inversely proportional to the length of the membrane.
  • Keywords
    membranes; microactuators; microelectrodes; microsensors; microvalves; pressure sensors; stiction; MEMS actuators; MEMS sensors; closed-form solution; conductive elastic membrane; elastic membrane theory; electric potential difference; equilibrium states; membrane modeling; microvalves; nonequilibrium states; nonlinear electromechanical coupling; pressure sensors; pull-in instability; rigid ground electrode; stiction failure mode; tensile force; Actuators; Biomembranes; Closed-form solution; Couplings; Electrodes; Electromechanical sensors; Microelectromechanical devices; Micromechanical devices; Microvalves; Prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2002. Proceedings of IEEE
  • Print_ISBN
    0-7803-7454-1
  • Type

    conf

  • DOI
    10.1109/ICSENS.2002.1037285
  • Filename
    1037285