• DocumentCode
    2314399
  • Title

    An impedance spectroscopic study of MEMS microphones

  • Author

    Lee, Sung B. ; Loeppert, Peter V.

  • Author_Institution
    Knowles Electron., LLC, Itasca, IL, USA
  • Volume
    2
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1250
  • Abstract
    In this paper we present a study of the mechanical properties of MEMS microphones using impedance spectroscopy. An ideal microphone model was used to derive the equation of motion of the diaphragm and the electrical impedance of the microphone as a function of frequency. Both measurements and model show that the phase of the impedance is sensitive to the changes in the mechanical parameters of the microphone. The model predicts the presence of a peak near the mechanical resonance in the phase vs. frequency graph with the following properties: increasing the bias increases the peak height; increasing the diaphragm stiffness shifts the peak position to a higher-frequency; and decreasing the relative damping widens the peak width. This behavior is confirmed with actual measurements of the impedance. From the close correlation between measurement and model we deduce the actual damping of the diaphragm to be approximately 1 × 10-4 kg/s.
  • Keywords
    damping; diaphragms; electric impedance imaging; micromechanical devices; microphones; MEMS microphones; diaphragm stiffness; electrical impedance; equation of motion; ideal microphone model; impedance spectroscopic study; mechanical parameters; relative damping; Damping; Electrochemical impedance spectroscopy; Equations; Frequency; Impedance measurement; Mechanical factors; Mechanical variables measurement; Micromechanical devices; Microphones; Phase measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2002. Proceedings of IEEE
  • Print_ISBN
    0-7803-7454-1
  • Type

    conf

  • DOI
    10.1109/ICSENS.2002.1037295
  • Filename
    1037295