Gettering effect inside the glass packaged FED panel

Author

Kwon, Sang Jik ; Ryu, Kyung Sun ; Cho, Tae Hee ; Lee, Jong Duk

Author_Institution

Dept. of Electron. Eng., Kyungwon Univ., Kyunggi, South Korea

fYear

1998

fDate

19-24 July 1998

Firstpage

55

Lastpage

56

Abstract

High vacuum sealing is one of the most challenging technologies in commercializing FEDs. We have tried to package a Si FEA or a Mo FEA on Si substrate with 0.7inch diagonal by using a soldering method. In this paper, we have evaluated the vacuum level inside the FED panel, which determines the performance of FED, by measuring the emission currents during packaging and comparing it with the calibrated values measured in a test chamber. We evaluate that a getter plays a role of in-situ mini pump during the life of the sealed FED.

Keywords

calibration; field emission displays; flat panel displays; getters; semiconductor device packaging; soldering; 0.7 in; calibrated values; emission currents; gettering effect; glass packaged FED panel; high vacuum sealing; in-situ mini pump; packaging; soldering method; vacuum level; Cathodes; Current measurement; Electronics packaging; Gettering; Glass; Impurities; Stress; Sun; Testing; Vacuum technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Microelectronics Conference, 1998. Eleventh International

Conference_Location

Asheville, NC, USA

Print_ISBN

0-7803-5096-0

Type

conf

DOI

10.1109/IVMC.1998.728636

Filename

728636