DocumentCode
2319921
Title
STM study of diamond films electron field emission
Author
Rakhimov, A.T. ; Suetin, N.V. ; Soldatov, E.S. ; Timofeyev, M.A. ; Trifonov, A.S. ; Khanin, V.V.
Author_Institution
Inst. of Nucl. Phys., Moscow State Univ., Russia
fYear
1998
fDate
19-24 July 1998
Firstpage
224
Lastpage
225
Abstract
It is known, that diamond films have good emission properties. However, some important aspects of this phenomenon remain unexplored. The data about nanoscale structure and properties of the films can help to establish these problems. These data are obtainable by scanning tunneling microscope (STM). The experiment data can help to find a resolution of recognizing the current nature at the different regions of a sample. The aim of this work is to study the morphologic and emission characteristics of these films at the nanoscale.
Keywords
crystal morphology; diamond; electron field emission; nanostructured materials; scanning tunnelling microscopy; thin films; C; STM; diamond films; electron field emission; emission characteristics; morphology; nanoscale structure; scanning tunneling microscopy; Current measurement; Electron emission; Microscopy; Nuclear physics; Shape; Surface morphology; Surface resistance; Surface topography; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location
Asheville, NC, USA
Print_ISBN
0-7803-5096-0
Type
conf
DOI
10.1109/IVMC.1998.728730
Filename
728730
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