• DocumentCode
    2320771
  • Title

    3D ray-tracing model including effect of inhomogeneous building surface for characterization of wireless communication channel

  • Author

    Koh, Il-Suek ; Kwon, Sewoong ; Lim, Jae-Woo ; Yoon, Young Joong

  • Author_Institution
    Inha Univ., Incheon
  • fYear
    2007
  • fDate
    9-15 June 2007
  • Firstpage
    4116
  • Lastpage
    4119
  • Abstract
    A ray-tracing method in conjunction with UTD (uniform theory of diffraction) has been widely used to characterize a wireless communication channel. Due to the complexity of the real situation, the ray-tracing method generally assumes buildings have homogeneous and smooth surfaces. However, in a real case, the building surface consists of many heterogeneous materials, whose shapes are also various. Hence, the scattering by the surface is much different from a homogeneous surface, which will affect the final accuracy of the ray-tracing method. In UTD, scattering mechanism by an object is mainly decomposed into two groups: reflection and diffraction. In general, the reflection in the specular direction is important, but the inhomogeneity may reduce the specular reflection drastically. In this paper, to consider the reduction of the specular reflection, we formulate the effective specular reflection based on PO (physical optics) approximation, and include the reflection in a 3D ray-tracing code. Then, we investigate the inhomogeneity effect on the final path-loss.
  • Keywords
    electromagnetic wave diffraction; ray tracing; wireless channels; 3D ray-tracing model; inhomogeneous building surface; physical optics approximation; specular reflection; uniform theory of diffraction; wireless communication channel; Building materials; Concrete; Dielectric materials; Glass; Information technology; Optical reflection; Optical scattering; Optical surface waves; Ray tracing; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-0877-1
  • Electronic_ISBN
    978-1-4244-0878-8
  • Type

    conf

  • DOI
    10.1109/APS.2007.4396446
  • Filename
    4396446