DocumentCode
2322411
Title
Comparison of high mobility AlGaN/GaN heterostructures grown by MBE on HVPE GaN templates and directly nucleated on sapphire
Author
Manfra, M.J. ; Weimann, N.G. ; Hsu, J.W.P. ; Pfeiffer, L.N. ; West, K.W. ; Molnar, R.J.
Author_Institution
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
fYear
2002
fDate
15-20 Sept. 2002
Firstpage
231
Lastpage
232
Abstract
We compare molecular beam epitaxy growth of high electron mobility AlGaN/GaN heterostructures grown homoepitaxially on semi-insulating (SI) GaN templates prepared by hydride vapor phase epitaxy (HVPE) with structures grown completely by MBE on sapphire substrates. The quality of our MBE grown AlGaN/GaN heterostructures on HVPE templates has been proven by a record low temperature two-dimensional electron gas (2DEG) mobility of 75,000 cm/sup 2//Vs at T=4.2 K. Recently, we have developed Zn-compensated HVPE GaN templates that are highly resistive at room temperature (/spl rho//spl sim/10/sup 8//spl Omega/cm). MBE grown heterostructures grown on SI HVPE GaN are electrically isolated from the substrate at all temperatures from 300 K down to T=4.2 K. We report on the first high electron mobility transistors (HEMTs) grown by MBE on a HVPE GaN template.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; 300 K; 4.2 K; Al/sub 2/O/sub 3/; AlGaN-GaN; GaN; MBE grown heterostructures; Zn-compensated hydride vapor phase epitaxy GaN templates; high electron mobility transistors; high mobility AlGaN/GaN heterostructures; low temperature two-dimensional electron gas mobility; molecular beam epitaxy growth; sapphire substrates; semi-insulating GaN templates; Aluminum gallium nitride; Electron mobility; Gallium nitride; HEMTs; Hall effect; MODFETs; Molecular beam epitaxial growth; Substrates; Surface morphology; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Molecular Beam Epitaxy, 2002 International Conference on
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7581-5
Type
conf
DOI
10.1109/MBE.2002.1037844
Filename
1037844
Link To Document